Difference between revisions of "MainPage:Nuclear:NPS:PWO:CrystalLOG:SICCAJ32"

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| 03/17/2016 || Pictures || Documentation of crystal's conditions as it arrived at CUA.
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| 03/17/2016 ||  Salina || Pictures || Documentation of crystal's conditions as it arrived at CUA.
 
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| 03/18/2016 || Thermal annealing || Ramp up at 18oC/hour up to 200oC. Stays for 10 hours and ramp down at 18oC/hour.
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| 03/18/2016 ||  Salina || Thermal annealing || Ramp up at 18oC/hour up to 200oC. Stays for 10 hours and ramp down at 18oC/hour.
 
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| 04/15/2016 || Light Yield || Run 3191: crystal wrapped with ~5 layers of teflon tape and 2 layers of black tape. Steps of 20min, 1cm. T=18oC. LY = 18.41 pe/MeV.
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| 04/15/2016 ||  Salina || Light Yield || Run 3191: crystal wrapped with ~5 layers of teflon tape and 2 layers of black tape. Steps of 20min, 1cm. T=18oC. LY = 18.41 pe/MeV.
 
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| 05/17/2016 || Transverse Transmittance || At the center of the crystal, every nm from 200nm until 800nm. Sample: 1348
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| 05/17/2016 ||  Salina || Transverse Transmittance || At the center of the crystal, every nm from 200nm until 800nm. Sample: 1348
 
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| 05/20/2016 || Transverse Transmittance Scan || Wavelengths: 360nm, 420nm, 620nm. Sampling period: 0.6s, moving motor at 2mm/s.
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| 05/20/2016 ||  Salina ||Transverse Transmittance Scan || Wavelengths: 360nm, 420nm, 620nm. Sampling period: 0.6s, moving motor at 2mm/s.
 
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| 07/07/2016 || Longitudinal Transmittance Scan || Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
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| 07/07/2016 ||  Summer Students ||Longitudinal Transmittance Scan || Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
 
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| 07/27/2016 ||  Light Yield || Run 3274. 300ns gw. >50,000 incidents ~3 layers of teflon tape ~1 layer of electrical.
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| 07/27/2016 ||  Summer Students || Light Yield || Run 3274. 300ns gw. >50,000 incidents ~3 layers of teflon tape ~1 layer of electrical.
 
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|01/06/2017 || Rich/TH || Light Yield || 3 layers teflon, 2 layers black tape, run 3534, result: 8.07 pe/MeV.
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|01/06/2017 || Rich/TH || Transverse Transmittance || before irradiation.
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|01/06/2017 || Rich/TH || Transverse Transmittance || before irradiation.
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|01/06/2017 || Rich/TH || Transverse+Longitudinal Transmittance || after irradiation.
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|01/06/2017 || Rich/TH || Crystal accident - two pieces chip off at one end (see pictures below).
 
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Revision as of 00:50, 8 January 2017

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Time LOG

SICCA J32
Date Description Comments
03/17/2016 Salina Pictures Documentation of crystal's conditions as it arrived at CUA.
03/18/2016 Salina Thermal annealing Ramp up at 18oC/hour up to 200oC. Stays for 10 hours and ramp down at 18oC/hour.
04/15/2016 Salina Light Yield Run 3191: crystal wrapped with ~5 layers of teflon tape and 2 layers of black tape. Steps of 20min, 1cm. T=18oC. LY = 18.41 pe/MeV.
05/17/2016 Salina Transverse Transmittance At the center of the crystal, every nm from 200nm until 800nm. Sample: 1348
05/20/2016 Salina Transverse Transmittance Scan Wavelengths: 360nm, 420nm, 620nm. Sampling period: 0.6s, moving motor at 2mm/s.
07/07/2016 Summer Students Longitudinal Transmittance Scan Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
07/27/2016 Summer Students Light Yield Run 3274. 300ns gw. >50,000 incidents ~3 layers of teflon tape ~1 layer of electrical.
01/06/2017 Rich/TH Light Yield 3 layers teflon, 2 layers black tape, run 3534, result: 8.07 pe/MeV.
01/06/2017 Rich/TH Transverse Transmittance before irradiation.
01/06/2017 Rich/TH Transverse Transmittance before irradiation.
01/06/2017 Rich/TH Transverse+Longitudinal Transmittance after irradiation.
01/06/2017 Rich/TH Crystal accident - two pieces chip off at one end (see pictures below).

Pictures at 03/17/2016

Internal defect (dirty?) inside the structure.
Small chipped parts on one edge.